Needle Dresser System
The Needle Dresser System is developed for cleaning radius probe tips on standard Probe Card, resulting in lower contact resistance. In addition to cleaning probe tips, the System is able to maintain radius probe tips by using an exclusive cleaning sheet, the Needle Dresser Wafer. Using soft abrasives for cleaning the Needle Dresser Wafer causes significantly less probe wear than hard sanding.
Pad debris is removed from probe tips by repeatedly touching down on the Needle Dresser Wafer. Unlike standard sanding paper, the Needle Dresser Wafer is relatively soft, allowing the probe tips to pass into the sheet material when overdriven. This action removes any debris embedded in the probe tips and at the same time reshapes (dresses) the probe tips. As a result, the Needle Dresser System will improve device yield and prolong the life of probe cards.