Ultra-Low-Leakage Probes for Keithley S600 Parametric Tester
The new Ultra-Low-Leakage Probe allows high-precision parametric measurements with extremely low leakage current. The Ultra-Low-Leakage probe utilizes a coaxial shield that can be driven (with a guard driver) to act as a guard. When used in conjunction with a high precision test-system, the resulting leakage current can be less than 1fA @ 1VDC. Moreover, the probe lifetime is about 3x longer than ceramic blades.
Features: Less than 1fA @ 1VDC leakage after 3 seconds Resistance between the probe and the coaxial shield is greater than 1014ohms Special probe card design contributes just 1pF capacitance Its unique two-layer design minimizes dielectric absorption Teflon-insulated coaxial feed-throughs isolate the measurement signals from the leakage-prone PCB base material designed for use with prober madels made by TEL, EG, and TSK
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Specifications: Type: Epoxy-Ring Probe Card with Coaxial Probes (up to 64 probes)
Probe Materials: Rhenium Tungsten (standard), Paliney 7, or J-Probe
Temperature: -55°C to 200°C
Leakage 1fA @ 1 VDC
Capacitance: 1pF typ ( pin to adjacent pin); 200fF typ (pin to non-adjacent pin)
Pitch: Minimum 110µm
Probe Diameter: 8mil (200µm)
Tip Diameter: 1.2mil (30µm)
Tip Length: 9mil (230µm)
Tip Shape: Flat
Beam: 236mil (6mm)
BCF 2.0 gram/mil standard
Scrub at 50µ: same as epoxy type
Depth Bottom: 245mil ±10mil (6223µm ± 254µm)
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Ultra-Low-Leakage probes can also be used for other parametric testers. Contact our technical department for more information.
