Ultra-Low-Leakage Measurement



Ultra-Low-Leakage probes for Ultra-Low-Leakage measurement or for Keithley S600 Parametric Tester 

Our new ultra-low-leakage probe allows high-precision measurement with extremely low leakage current. The ultra-low-leakage probe utilizes a coaxial shield that can be driven (with guard driver) to act as a guard. When used in conjunction with a high-precision test system, the resulting leakage current can be less than 10fA @ 1VDC.



 

Features:

  • Less than 10fA @ 1VDC leakage after 200ms
  • Resistance between the probe and the coaxial shield is greater than 1014ohms
  • Special Probe Card design contributes just 1pF capacitance compared to 50-100pF from typical Probe Cards
  • Semi-rigid coaxial wire feed-throughts isolate the measurement signals from thje leakage-prone PCB base material
  • Containing both tester patterns the 9" Combo Probe Card allows use of both HP 4062 and HP 4071 systems with one Probe Card
  • Probe Card can be used with both the HP-4062 Xandex interface and the standard interface for HP-4071
  • Designed for use with prober medels made by EG



Ultra-Low-Leakage Measurement


Epoxy Ring 

  • Type: Epoxy-Ring Probe Card with coaxial probes
        (up to 48 probes)
  • Probe materials: Rhenium Tungsten (standard),
        Paliney 7 or J-Probe
  • Temperature: -55°C to 150°C
  • Leakage: 10fA @ 1VDC
  • Capacitance: 1pF
  • Pitch: minimum 110µm
  • Probe diameter: 8mil (200µm)
  • Tip Diameter: 1.2mil (30µm)
  • Tip Length: 9mil
  • Tip Shape: Flat
  • Beam: 236mil (6mm)
  • BCF: 2.0g/mil (standard)
  • Scrubat 50µ: same as epoxy type
  • Depth bottom: 240mil ±10mil (6096µm ± 254µm)
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    UWE ELECTRONIC