Spring Contact Probes by reference



Reference Centers Nominal Length
 max. Travel Type Application
ICT-50C 1,27 35,59 6,35 High Performance In-Circuit Probe In-Circuit Probes
ICT-50J 1,27 43,69 6,35 High Performance In-Circuit Probe In-Circuit Probes
S-50C 1,27 35,59 6,35 In-Circuit In-Circuit Probes
S-50J 1,27 43,69 6,35 In-Circuit In-Circuit Probes
ICT-075 1,91 33,27 6,35 High Performance In-Circuit Probe In-Circuit Probes
S-075 1,91 33,27 6,35 In-Circuit In-Circuit Probes
ICT-L075 1,91 37,08 10,16 High Performance In-Circuit Probe In-Circuit Probes
S-100 2,54 33,27 6,35 In-Circuit In-Circuit Probes
ICT-100 2,54 33,27 6,35 High Performance In-Circuit Probe In-Circuit Probes
ICT-L100 2,54 37,08 10,16 High Performance In-Circuit Probe In-Circuit Probes
S-50-C-Rotator 1,27 34,59 6,35 Rotator Probe Rotation Probes
S-075-Rotator 1,91 33,27 6,35 Rotator Probe Rotation Probes
S-50-J-Rotator 1,91 33,27 6,35 Rotator Probe Rotation Probes
S-100-Rotator 2,54 33,27 6,35 Rotator Probe Rotation Probes
PI-137 1,91 22,23   Interface Pin Interface Probes
PI-301 1,91 17,60   Interface Pin Interface Probes
PI-410 1,91 17,78   Interface Pin Interface Probes
SS-40 0,99 15,75 1,27 Bareboard Standard Probes
S-00 0,99 16,76 2,28 Bareboard Standard Probes
Duraseal S-00 0,99 16,76 2,28 Bareboard Probe with Attached Wire Standard Probes
SS-30 0,99 15,49 2,54 Bareboard Standard Probes
SS-50 1,27 15,49 1,27 Bareboard Standard Probes
S-0 1,27 16,76 2,54 Bareboard Standard Probes
SS-75 1,91 15,75 1,27 Bareboard Standard Probes
S-1 1,91 17,02 2,54 Bareboard Standard Probes
GSS-100 2,54 8,76 1,27 Bareboard Standard Probes
SS-100 2,54 8,76 1,27 Bareboard Standard Probes
S-2 2,54 24,64 4,64 Bareboard Standard Probes
S-3 3,18 33,27 6,35 In-Circuit Standard Probes
S-4 3,96 33,78 6,35 In-Circuit Standard Probes
S-5 4,75 36,07 6,35 In-Circuit Standard Probes
SH-100 2,54 33,27 6,35 High Current Probe High Current Probes
SH-3 3,18 33,27 6,35 High Current Probe High Current Probes
SH-4 3,96 33,78 6,35 High Current Probe High Current Probes
SH-5 4,75 36,07 6,35 High Current Probe High Current Probes
PENTA-0 0,25 14,99 1,27 Fine Pitch Probe Micro Probes
QUAD-00 0,51 18,80 2,54 Fine Pitch Probe Micro Probes
QUAD-0 0,51 22,86 2,54 Fine Pitch Probe Micro Probes


Reference
 Centers Nominal Length max. Travel
Properties Application

20338

 0,75 3,05 0,55 Battery Probes
12401 1,27 9,47 1,52 Press Ring Battery Probes
10741 / 11267 1,91 9,47 1,52   Battery Probes
10742 / 11271 1,91 9,47 1,52   Battery Probes
11054 1,91 9,47 1,52 Press Ring Battery Probes
11552 1,91 10,95 2,26   Battery Probes

12610

 2,54 7,50 1,00 Solder Cup Battery Probes

12611

 2,54 11,00 2,50

Solder Cup

Battery Probes

12612

 2,54 7,20 0,71

Solder Cup

Battery Probes

12613

 2,54 10,50 2,00 Solder Cup Battery Probes
12614 2,54 7,20 0,71 Solder Cup Battery Probes

12615

 2,54 10,50 2,00 Solder Cup Battery Probes
12616 2,54 7,50 1,00 Thru Hole Mount Battery Probes

12617

 2,54 11,00 2,50 Thru Hole Mount

Battery Probes

12618

 2,54 7,20 0,71 Thru Hole Mount Battery Probes

12619

 2,54 10,50 2,00 Thru Hole Mount Battery Probes

12620

 2,54 7,20 0,71 Thru Hole Mount Battery Probes

12621

 2,54 10,50 2,00 Thru Hole Mount Battery Probes

12622

 2,54 5,00 1,00 Surface Mount Battery Probes

12623

 2,54 8,50 2,50 Surface Mount Battery Probes

12624

 2,54 4,70 0,71 Surface Mount Battery Probes

12625

 2,54 8,00 2,00 Surface Mount Battery Probes

12626

 2,54 4,70 0,71 Surface Mount Battery Probes
12627 2,54 8,00 2,00 Surface Mount Battery Probes
12120 2,54 4,00 1,00 Battery Contact Battery Probes
12127 2,54 8,00 2,00 Battery Contact Battery Probes
12128 2,54 11,50 2,54 Battery Contact Battery Probes
12193 2,54 8,03 2,55 Battery Contact Battery Probes
11322 3,18 8,26 2,28 Mounting Flange Battery Probes
10872 4,45 4,40 1,02 Mounting Flange Battery Probes
12141 /12142 4,45 17,15 2,28 Attached Receptacle Battery Probes
10758 4,45 10,03 2,29 Mounting Flange Battery Probes
11290 4,45 13,03 2,29 Mounting Flange Battery Probes
10717 4,45 9,02 2,54 Mounting Flange Battery Probes
12539 6,35 13,21 2,08 Mounting Flange Battery Probes


Reference
 Centers Nominal Length Resistance Signal Path Length Application
101210 0,50 5,87 50 mΩ 5,21 Semiconductor Probes
101001 0,50 2,67 50 mΩ 2,37 Semiconductor Probes
101041 0,50 3,30 50 mΩ 2,92 Semiconductor Probes
100938 0,65 5,72 50 mΩ 4,75 Semiconductor Probes
101084 0,75 5,94 50 mΩ 5,21 Semiconductor Probes
101111 0,75 3,05 50 mΩ 2,49 Semiconductor Probes
100404 1,00 4,57 50 mΩ 3,89 Semiconductor Probes
100881 1,00 5,97 50 mΩ 5,46 Semiconductor Probes
101312-001-952-B 1,00 7,37 50 mΩ 6,35 Semiconductor Probes
101068 1,00 6,60 50 mΩ 5,84 Semiconductor Probes
100785 1,27 10,72
9,19 Semiconductor Probes
DE-50 1,27 13,21
11,94 Semiconductor Probes
101150 1,27 3,51 50 mΩ 3,00 Semiconductor Probes
DE-100 2,54 13,21
  Semiconductor Probes
 101500  0,50  5,74/6,74 100 mΩ 5,26/6,26
Semiconductor Probes
 101303  0,40 3,3
 40 mΩ 2,90
 Semiconductor Probes
 623-0286 0,40
 3,3
60 mΩ 2,80
 Semiconductor Probes
 623-0334 0,40
 3,8
 60 mΩ 3,30
 Semiconductor Probes
 200-000940 0,40
 4,75
 80 mΩ 4,05
 Semiconductor Probes
 623-0248 0,40
 5,64/5,44/5,62
 60 mΩ 5,04/4,84/5,02
 Semiconductor Probes
 623-0249 0,40
 2,87
 50 mΩ 2,49
 Semiconductor Probes
 101267 0,50
 3,30
 40 mΩ 2,92
 Semiconductor Probes
 101369 0,50
 3,99
 40 mΩ 3,43
 Semiconductor Probes
 623-0290 0,50
 5,16
 45 mΩ 4,56
 Semiconductor Probes
 101245 0,50
 5,74
 50 mΩ 5,26
 Semiconductor Probes
623-0047 0,50
 5,98
 45 mΩ 5,28
 Semiconductor Probes
623-0303 0,65
 3,70
 40 mΩ 3,10
 Semiconductor Probes
100938 0,65
 5,72
 70 mΩ 4,75
 Semiconductor Probes
623-0270 0,80
 2,65
 40 mΩ
 2,15
 Semiconductor Probes
623-0271 0,80
 2,65
 40 mΩ 2,15
 Semiconductor Probes
623-0195 0,80
 4,84
 50 mΩ 4,04
 Semiconductor Probes
101246/101313 0,80
 5,94
 40 mΩ 5,21
 Semiconductor Probes
101312 1,00
 7,37
 40 mΩ 6,35
 Semiconductor Probes
623-0117 1,00
 4,75
 60 mΩ 3,90
 Semiconductor Probes
100785 1,27
 10,72
 50 mΩ 9,19
 Semiconductor Probes
Dyno 0.4mm 0,40
 3,14
 20 mΩ 2,92
 Semiconductor Probes
Dyno 0.5mm 0,50
 3,14
 20 mΩ 2,92
 Semiconductor Probes
101267 0,50
 3,30
 40 mΩ 2,92
 Semiconductor Probes



Reference
 Centers   Impedance Properties Application
100547 1,78   50 mΩ Double Ended Coaxial Probes
100780 2,54
50 Ohms
1.0 dB @ 4.5 GHz		 Single Ended - with Cable Coaxial Probes
100546 2,54   50 mΩ Double Ended Coaxial Probes
100336 3,81   50 mΩ Double Ended Coaxial Probes
100305 3,81   50 mΩ Single Ended Coaxial Probes
100526 3,81   50 mΩ Single Ended - with Cable Coaxial Probes
100304 5,08   50 mΩ Single Ended Coaxial Probes
100290 5,08   50 mΩ Double Ended Probe Coaxial Probes
100999 5,08   50 mΩ NonRotating Shielding Plunger with Cable Coaxial Probes
100445 5,08   50 mΩ Single Ended - with Cable Coaxial Probes
100559 7,62   50 mΩ Single Ended, SMB Connector Coaxial Probes
100910 7,62   50 mΩ Single Ended, SMB Connector Coaxial Probes
100563 7,62   50 mΩ Single Ended, SMB Connector Coaxial Probes


Reference
 Centers Nominal Length max. Travel   Application
SK-3 3,18 27,43 2,79   Kelvin Contacts
SK-5 4,75 42,44 6,35   Kelvin Contacts


Reference Centers Nominal Length Working Travel
 Temperature Range
 Application
100895 Thermocouple 3,96
 13,84  1,52  150°C / 260°C
 Thermoelements


Reference
 Centers
 Nominal Length max. Travel
Travel to Switch Point Application
SW-3 3,18 46,48 7,49 0,64 Switch Probes
SW-4 3,96 49,02 4,64 2,72 Switch Probes
SW-5 4,75 70,10 4,83 0,76 Switch Probes
 
UWE ELECTRONIC