Reliable contact even for strong contamination due to patented rotator probes

Contamination, corrosion or residua of solder effect seriously the contact within the Incircuit- and Functional test. These failures result in adulteration of measured values and false diagnosis for zero defect components. The components are misvalued unnecessarily and get repaired or replaced. We offer a solution for this problem: a rotating spring probe.
- Axial rotation of the ultra-aggressive tip up to 90°
- Reliable contact even for extreme contamination
- Pitch: 100 / 75 / 50 mil (2,54 / 1,91 / 1,27 mm)
- Smaller spring force due to rotation
- Special Duralloy-plating: guarantees very good hardness, abrasion resistance and transition resistance comparable to hard gold.
- The ultra-aggressive tip ensures a proper contact for more than 120.00 cycles
- Interchangeability against all common probes used in Incircuit- and Functional Tests
| S-100 Rotator | S-075 Rotator | S-50-J Rotator | S-50-C Rotator |
| data sheet | data sheet | data sheet | data sheet |
| nominal length: 33,27mm diameter: 1,37mm |
nominal length: 33,27mm diameter: 1,00mm |
nominal length: 43,23mm diameter: 0,79mm |
nominal length: 34,59mm diameter: 0,79mm |
Sous réserve de modifications ou d'erreurs.


