Using the spring contact probes for semiconductor package inspection, customers can test various types of packages with LEENO’s Total Interface Solution.
Product Series
Feinrastersonde
From Fine Pitch Probe
Barrel Diameter: 0,08 mm ~
Probe Length: A mm ~ 4,5 mm ~ Z mm
RF Sonde
RF Probe
Barrel Diameter: 0,25 mm
Probe Length: 0,85 mm ~ 1,23 mm ~ Z mm