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leeno semiconductor probeUsing the spring contact probes for semiconductor package inspection, customers can test various types of packages with LEENO’s Total Interface Solution.

Product Series


leeno semiconductor fine pitch probe

From Fine Pitch Probe
Barrel Diameter: 0,08 mm ~
Probe Length: A mm ~ 4,5 mm ~ Z mm

RF Sonde

leeno semiconductor rf probe

RF Probe
Barrel Diameter: 0,25 mm
Probe Length: 0,85 mm ~ 1,23 mm ~ Z mm